Prebuilt Geometries

Each factory function returns a fully configured AdHocDiffractometer instance. Geometries are grouped below by their chi-circle mechanism.

Eulerian four-circle

The chi circle is a full Eulerian cradle; omega and 2θ share the same rotation axis.

Synchrotron

Vertical scattering plane — ω and 2θ rotate about the transverse axis.

fourcv — Eulerian Four-Circle (Synchrotron)

Laboratory

Horizontal scattering plane — ω and 2θ rotate about the vertical axis.

fourch — Eulerian Four-Circle (Laboratory)

Eulerian five- and six-circle

A four-circle Eulerian sample stack extended with one or two additional base or detector stages.

Five-circle (fivec)

fourcv on a vertical mu base; sample and detector coupled through mu. Vlieg et al. (1987).

fivec — Eulerian Five-Circle (Vlieg et al. 1987)

4S+2D (psic)

Four sample stages (mu, eta, chi, and phi) and two independent detector stages (nu, delta). You (1999).

psic — Eulerian Six-Circle, 4S+2D (You 1999)

Shared base (sixc)

Sample and detector share a common alpha base stage. Lohmeier & Vlieg (1993).

sixc — Eulerian Six-Circle, Surface (Lohmeier & Vlieg 1993)

Kappa

The chi circle is replaced by a kappa axis tilted at α = 50° from the vertical, giving a larger accessible volume and fewer mechanical obstructions.

Four-circle synchrotron

Vertical scattering plane.

kappa4cv — Kappa Four-Circle (Synchrotron)

Four-circle laboratory

Horizontal scattering plane.

kappa4ch — Kappa Four-Circle (Laboratory)

Six-circle

Psic-style outer axes (mu, nu) with kappa inner sample stages.

kappa6c — Kappa Six-Circle

Surface / special

Geometries designed for surface diffraction or with fully decoupled sample and detector axes.

Z-axis

Surface normal parallel to Z. Sample and detector share an alpha base stage. Bloch (1985).

zaxis — Z-Axis Four-Circle (Surface)

Decoupled axes

Two fully independent sample axes (mu, Z) and two detector axes (nu, delta). Evans-Lutterodt & Tang (1995).

s2d2 — S2D2 General-Inclination Four-Circle